For surface roughness measurements, the specimens were examined for topographical quality using an Environmental Scanning Electron Microscope (ESEM) (Quanta 200, FEI Company, Philips, Netherland). Specimens were photomicrographed at 1000 times magnification and the images were analyzed quantitatively using image analysis software. A three-dimensional surface roughness profile was automatically plotted. At the Z-axis, the peaks or surface elevations were marked, and the height of each peak was automatically computed. Mean surface roughness values (Ra) were calculated for each specimen. Ra describes the arithmetic mean of all values of the roughness profile (R) over the evaluated length.